Experimental up-scaling of thermal conductivity reductions in silicon by vacancy-engineering: From the nano-To the micro-scale

  • Neil M. Wight
  • , Nick S. Bennett

科研成果: Conference article同行评审

指纹

探究 'Experimental up-scaling of thermal conductivity reductions in silicon by vacancy-engineering: From the nano-To the micro-scale' 的科研主题。它们共同构成独一无二的指纹。
分类

Material Science