摘要
A method to reduce the thermal conductivity in Si thin-films by at least an order of magnitude is shown, successfully demonstrating the up-scaling of this technique from Si nano-films. High energy self implantation of Si is used to create a supersaturation of lattice vacancy concentrations that remain following post implant rapid thermal annealing producing a disruption in phonon mode thermal transport. This method demonstrates an approach for micro-harvesting thermoelectric device applications without the difficulties faced for dimensional up-scaling in alternative Si thermoelectric approaches. Challenges surrounding the thermal budget required for post implant dopant activation in p-Type Si are also shown.
| 源语言 | English |
|---|---|
| 页(从-至) | 10211-10217 |
| 页数 | 7 |
| 期刊 | Materials Today: Proceedings |
| 卷 | 5 |
| 期 | 4 (1) |
| DOI | |
| 出版状态 | Published - 22 5月 2018 |
| 活动 | 14th European Conference on Thermoelectrics, ECT2016 - Lisbon, Portugal 期限: 20 9月 2016 → 23 9月 2016 |
指纹
探究 'Experimental up-scaling of thermal conductivity reductions in silicon by vacancy-engineering: From the nano-To the micro-scale' 的科研主题。它们共同构成独一无二的指纹。引用此
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