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An overview of site testing and site characterisation, as applied in the search for an astronomical site in Kenya

  • Edward Graham
  • , Richard Vaughan
  • , David Buckley
  • , Acacia Leakey
  • , Colin Snodgrass
  • , Paul Baki
  • , Susan Murbana
  • , Chu Owens
  • , Dan Hillier

科研成果: Conference contribution

摘要

The first half of this short paper provides a brief introductory overview of methods to aid astronomical site testing, characterization and selection. In the second half, we describe how some of these methodologies have been applied in the search for an optical astronomical site in Kenya over the past decade.

源语言English
主期刊名Astronomy in Focus - As presented at the IAU 32nd General Assembly, 2024
编辑Diana M. Worrall
出版商Cambridge University Press
页11-15
页数5
卷20
版本A32
ISBN(电子版)9781009399227, 9781009433341, 9781009545860, 9781009546102, 9781009546126, 9781009866903
DOI
出版状态Published - 30 7月 2026
活动Astronomy in Focus - Presented at the 32nd IAU General Assembly, GA 2024 - Cape Town, South Africa
期限: 6 8月 2024 → 15 8月 2024

Conference

ConferenceAstronomy in Focus - Presented at the 32nd IAU General Assembly, GA 2024
国家/地区South Africa
市Cape Town
时期6/08/24 → 15/08/24

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