Resumen
The formation of an AlZnN alloy was investigated as a route to tune the bandgap of Zn3N2. A significant shift of the bandgap was observed in the deposited films, increasing from 1.4 eV for Zn3N2 to 2.8 eV for AlZnN alloys with an AlN fraction of × = 0.19. The refractive index followed a similar trend, approaching that of AlN. The charge carrier density of AlZnN samples was significantly reduced reaching values in the order of 1016 cm−3.
| Idioma original | English |
|---|---|
| Número de artículo | 100052 |
| Páginas (desde-hasta) | 1-4 |
| Número de páginas | 4 |
| Publicación | Materials Letters: X |
| Volumen | 7 |
| N.º | 100052 |
| Fecha en línea anticipada | 20 jul 2020 |
| DOI | |
| Estado | Published - 1 sept 2020 |
Huella
Profundice en los temas de investigación de 'Investigation of a novel AlZnN semiconductor alloy'. En conjunto forman una huella única.Citar esto
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