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An overview of site testing and site characterisation, as applied in the search for an astronomical site in Kenya

  • Edward Graham
  • , Richard Vaughan
  • , David Buckley
  • , Acacia Leakey
  • , Colin Snodgrass
  • , Paul Baki
  • , Susan Murbana
  • , Chu Owens
  • , Dan Hillier

Producción científica: Conference contribution

Resumen

The first half of this short paper provides a brief introductory overview of methods to aid astronomical site testing, characterization and selection. In the second half, we describe how some of these methodologies have been applied in the search for an optical astronomical site in Kenya over the past decade.

Idioma originalEnglish
Título de la publicación alojadaAstronomy in Focus - As presented at the IAU 32nd General Assembly, 2024
EditoresDiana M. Worrall
EditorialCambridge University Press
Páginas11-15
Número de páginas5
Volumen20
EdiciónA32
ISBN (versión digital)9781009399227, 9781009433341, 9781009545860, 9781009546102, 9781009546126, 9781009866903
DOI
EstadoPublished - 30 jul 2026
EventoAstronomy in Focus - Presented at the 32nd IAU General Assembly, GA 2024 - Cape Town, South Africa
Duración: 6 ago 2024 → 15 ago 2024

Conference

ConferenceAstronomy in Focus - Presented at the 32nd IAU General Assembly, GA 2024
País/TerritorioSouth Africa
CiudadCape Town
Período6/08/24 → 15/08/24

Huella

Profundice en los temas de investigación de 'An overview of site testing and site characterisation, as applied in the search for an astronomical site in Kenya'. En conjunto forman una huella única.

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