@article{21c0f76cff6a4494a531730570417681,
title = "An in-situ approach for preparing atom probe tomography specimens by xenon plasma-focussed ion beam",
abstract = "A method for the rapid preparation of atom probe tomography (APT) needles using a xenon plasma-focussed ion beam (FIB) instrument is presented and demonstrated on a test sample of Ti-6Al-4V alloy. The method requires significantly less operator input than the standard lift-out protocol, is site-specific and produces needles with minimal ion-beam damage; electron microscopy indicated the needle's surface amorphised/oxidised region to be less than 2 nm thick. The resulting needles were routinely analysable by APT, confirming the expected microstructure and showing negligible Xe contamination.",
keywords = "Atom probe tomography, Focussed ion beam, Sample preparation",
author = "Halpin, {J. E.} and Webster, {R. W.H.} and H. Gardner and Moody, {M. P.} and Bagot, {P. A.J.} and MacLaren, {D. A.}",
note = "Funding Information: The Glasgow Xe-plasma FIB is funded by the Engineering and Physical Sciences Research Council of the United Kingdom (EPSRC) under grant EP/P001483/1 and some of the work outlined here was conducted under EPSRC grant EP/N017218/1 . The Oxford Atom Probe facility is also EPSRC funded, by grant EP/M022803/1 . We gratefully acknowledge Adam Pilchak ( Air Force Research Laboratory , Wright Patterson) and Chris Collins ( Imperial College London ) for supplying the additional Ti-alloy materials used in Fig. 5 . {\textcopyright} 2019 The Authors. Published by Elsevier B.V. CC-BY The author was not affiliated to SAMS at the time of publication",
year = "2019",
month = jul,
day = "1",
doi = "10.1016/j.ultramic.2019.04.005",
language = "English",
volume = "202",
pages = "121--127",
journal = "Ultramicroscopy",
issn = "0304-3991",
publisher = "Elsevier B.V.",
}