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Weak anti-localization behavior of high mobility 2D hole gas in a strained Ge QW heterostructure

  • J. Foronda
  • , C. Morrison
  • , M. Myronov
  • , J. E. Halpin
  • , S. D. Rhead
  • , D. R. Leadley

Publikation: Conference contribution

Abstract

In summary we have measured the low temperature and low field MR of a high mobility Ge 2DHG. The resulting MR curves demonstrate WL-like behavior at temperatures below 2K with WAL-like behavior appearing between 3K and 12K. Evidence of WAL has not been previously observed in Ge. We believe this transition to be the result of a summation of WL and WAL effects in the main conduction channel and parallel conduction channel(s). This is a promising result for Ge as a possible channel for future spin-FETs.

OriginalspracheEnglish
Titel2014 7th International Silicon-Germanium Technology and Device Meeting, ISTDM 2014
Herausgeber (Verlag)IEEE Computer Society
Seiten111-112
Seitenumfang2
ISBN (Print)9781479954285
DOIs
PublikationsstatusPublished - 11 Aug. 2014
Veranstaltung7th International Silicon-Germanium Technology and Device Meeting, ISTDM 2014 - Singapore, Singapore
Dauer: 2 Juni 20144 Juni 2014

Publikationsreihe

Name2014 7th International Silicon-Germanium Technology and Device Meeting, ISTDM 2014

Conference

Conference7th International Silicon-Germanium Technology and Device Meeting, ISTDM 2014
Land/GebietSingapore
OrtSingapore
Zeitraum2/06/144/06/14

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