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Experimental up-scaling of thermal conductivity reductions in silicon by vacancy-engineering: From the nano-To the micro-scale

  • Neil M. Wight
  • , Nick S. Bennett

Publikation: Conference articleBegutachtung

Abstract

A method to reduce the thermal conductivity in Si thin-films by at least an order of magnitude is shown, successfully demonstrating the up-scaling of this technique from Si nano-films. High energy self implantation of Si is used to create a supersaturation of lattice vacancy concentrations that remain following post implant rapid thermal annealing producing a disruption in phonon mode thermal transport. This method demonstrates an approach for micro-harvesting thermoelectric device applications without the difficulties faced for dimensional up-scaling in alternative Si thermoelectric approaches. Challenges surrounding the thermal budget required for post implant dopant activation in p-Type Si are also shown.

OriginalspracheEnglish
Seiten (von - bis)10211-10217
Seitenumfang7
FachzeitschriftMaterials Today: Proceedings
Jahrgang5
Ausgabenummer4 (1)
DOIs
PublikationsstatusPublished - 22 Mai 2018
Veranstaltung14th European Conference on Thermoelectrics, ECT2016 - Lisbon, Portugal
Dauer: 20 Sept. 201623 Sept. 2016

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