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An overview of site testing and site characterisation, as applied in the search for an astronomical site in Kenya

  • Edward Graham
  • , Richard Vaughan
  • , David Buckley
  • , Acacia Leakey
  • , Colin Snodgrass
  • , Paul Baki
  • , Susan Murbana
  • , Chu Owens
  • , Dan Hillier

Publikation: Conference contribution

Abstract

The first half of this short paper provides a brief introductory overview of methods to aid astronomical site testing, characterization and selection. In the second half, we describe how some of these methodologies have been applied in the search for an optical astronomical site in Kenya over the past decade.

OriginalspracheEnglish
TitelAstronomy in Focus - As presented at the IAU 32nd General Assembly, 2024
Redakteure/-innenDiana M. Worrall
Herausgeber (Verlag)Cambridge University Press
Seiten11-15
Seitenumfang5
Band20
AuflageA32
ISBN (elektronisch)9781009399227, 9781009433341, 9781009545860, 9781009546102, 9781009546126, 9781009866903
DOIs
PublikationsstatusPublished - 30 Juli 2026
VeranstaltungAstronomy in Focus - Presented at the 32nd IAU General Assembly, GA 2024 - Cape Town, South Africa
Dauer: 6 Aug. 2024 → 15 Aug. 2024

Conference

ConferenceAstronomy in Focus - Presented at the 32nd IAU General Assembly, GA 2024
Land/GebietSouth Africa
OrtCape Town
Zeitraum6/08/24 → 15/08/24

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